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Beilstein J. Nanotechnol. 2018, 9, 1564–1572, doi:10.3762/bjnano.9.148
Figure 1: (a) Typical SEM back scattered electron (BSE) image of a LATP pellet sintered at 1000 °C and polish...
Figure 2: Correlative microscopy of selected areas on LATP sintered at 1050 °C and polished by hand. (a) SEM ...
Figure 3: Higher resolution images of part of the area shown in Figure 2d and Figure 2e. (a) Topography, (c) ESM amplitude, and...
Figure 4: Correlative microscopy images from LATP sintered at 1000 °C and polished by a focused-ion beam. (a)...
Figure 5: High magnification image of LATP polished by focused-ion beam showing the (a) topography and (c) ES...